Research highlight : UNIFORM TRACE SAMPLING IN VERY LARGE MODELS
UNIFORM TRACE SAMPLING IN VERY LARGE MODELS 6 November 2007
A new algorithm makes it possible to draw traces uniformly at random in very large models of concurrent systems.
Let a system described as some parallel composition of several transition systems. The algorithm makes it possible to draw traces uniformly at random in this system, without constructing its global model: a trace is drawn from every component following an adequate probability; then these traces are composed via some specific randomised merge strategy.
