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Research highlight : UNIFORM TRACE SAMPLING IN VERY LARGE MODELS
UNIFORM TRACE SAMPLING IN VERY LARGE MODELS
6 November 2007

A new algorithm makes it possible to draw traces uniformly at random in very large models of concurrent systems.
Let a system described as some parallel composition of several transition systems. The algorithm makes it possible to draw traces uniformly at random in this system, without constructing its global model: a trace is drawn from every component following an adequate probability; then these traces are composed via some specific randomised merge strategy.



Keyword
  ° Verification
  ° Model-Checking
  ° Formal Methods for Software Engineering

Group
  ° Bioinformatics
  ° Formal Testing and System Exploration

Contact
  ° GAUDEL Marie-Claude
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